Description :The seminar begins with an examination of the fundamental vocabulary and concepts related to metrology. Topics include: accuracy, precision, calibration, and "uncertainty ratios". Several of the standard methods for analyzing measurement variation are then described and explained, as derived from AIAG's Measurement System Analysis reference book. The methods include: Gage R&R (ANOVA method, for 3 gages, 3 persons, 3 replicates, and 10 parts), Gage Correlation (for 3 gages), Gage Linearity, and Gage Bias.The seminar ends with an explanation of how to combine all relevant uncertainty information into an "Uncertainty Budget" that helps determine the appropriate width of QC specification intervals (i.e., "guard-banded specifications"). Spreadsheets are used to demonstrate how to perform the methods described during the seminar.Areas Covered in the Session :Fundamental Vocabulary & ConceptsGage Repeatability and Reproducibility (ANOVA method)Gage CorrelationGage LinearityGage BiasUncertainty Budgets and Guard-banded SpecificationsWho Will Benefit:QA/QC SupervisorsProcess EngineersManufacturing EngineersQC/QC TechniciansManufacturing TechniciansR&D EngineersJohn Zorich has spent 35 years in the medical device manufacturing industry; the first 20 years were as a "regular" employee in the areas of R&D, Manufacturing, QA/QC, and Regulatory; the last 15 years were as consultant in the areas of QA/QC and Statistics.