Prof. Jordi Arbiol graduated in Physics at Universitat de Barcelona (UB) in 1997, where he also obtained his PhD (European Doctorate and PhD Extraordinary Award) in 2001 in the field of transmission electron microscopy (TEM) applied to nanostructured materials. He was Assistant Professor at UB. From 2009 to 2015 he was Group Leader at Institut de Ciència de Materials de Barcelona, ICMAB-CSIC. Since 2017 he is President of the Spanish Microscopy Society (SME), was Vice-President from 2013 to 2017 and since 2009 he is Member of its Executive Board. In 2018 he was elected as Member of the Executive Board of the International Federation of Societies for Microscopy (IFSM) (2019-2026). Since 2015 he is the leader of the Group of Advanced Electron Nanoscopy at Institut Català de Nanociència i Nanotecnologia (ICN2), CSIC and BIST. He has been awarded with the 2014 EMS Outstanding Paper Award, the EU40 Materials Prize 2014 (E-MRS), listed in the Top 40 under 40 Power List (2014) by The Analytical Scientist and the PhD Extraordinary Award in 2001 (UB). He has published more than 315 papers, cited more than 11971 WoS (15525 GoS) and h-index: 62 WoK (71 GoS).